Simulation of STM images of carbon nanotubes: Principles and illustrationsPh. Lambin and V. Meunier
During the last two years, a number of exciting results have been obtained from STM microscopy and spectroscopy of single-wall carbon nanotubes. In the present work, a theoretical modeling of scanning tunneling microscopy of the nanotubes is presented. This theory is based on the standard perturbation formulation of elastic tunneling within a tight-binding description of the pi-electrons of the nanotubes. It has been tested on planar graphite and transposed to the cylindrical geometry. The simplicity of the method makes it possible to investigate the effects of network curvature and topological defects in a systematic way. Several illustrations of topographical images and current-voltage characteristics will be given, and compared to available experimental data and other results from ab-initio calculations.
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