His research interests include the electronic properties of low-dimensional systems, quantum interference and confinement, mesoscopic physics, superconductivity, the quantum Hall effect, and scanning probe microscopy. Past work has focused on the study normal metal-superconductor nanostructures using the spectroscopic capabilities of scanning tunneling microscopy (STM). This cryogenic technique measures the local density of states, permitting us to see quantum mechanics in action in conducting systems. The focus of more recent research has been the development of a novel scanning probe microscopy: subsurface charge accumulation (SCA) imaging. Operating at a temperature of 300 mK, the microscope measures locally the capacitance between the sample and a sharp tip with extraordinary sensitivity. This extends the reach of scanned probe microscopy by allowing the electronic structure underneath semiconductor and insulator surfaces to be locally resolved in a cryogenic environment. SCA imaging has enormous potential for both basic research and as a diagnostic tool for semiconductor technology.
Education
1989 B.S.(Cum Laude) - Physics
University of Washington
1992 M.S. - Physics
University of Illinois (Urbana)
1995 Ph.D.- Physics
University of Illinois (Urbana)
1996-7 Postdoc
Massachusetts Institute of Technology