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Cypher Atomic Force Microscope/Scanning Probe Microscope

The Cypher™ Atomic Force Microscope/Scanning Probe Microscope (AFM/SPM) is a new instrument that is available in the Department of Physics and Astronomy's Condensed Matter Physics (CMP) group. This state of the art instrument was funded by the Center of Research Excellence in Complex Materials (CORE-CM) as one of the common facilities for the center. The Asylum - Cypher™ AFM is the first totally new small sample AFM/SPM in over a decade, with more capability, more control, more functionality, more modularity, and more resolution - all with over 20X faster scanning and striking ease of use.

For more details and technical information please refer to these websites:

Scanning Modes

• Contact    • AC    • Force    • Dual AC™    • Piezoresponse Force Microscopy (PFM)     • Electric Force Microscopy (EFM)    • Magnetic Force Microscopy (MFM)    • Surface Potential     • Nanolithography    • Nanomanipulation    • Frequency Modulation (FM)    • Operation in fluid

Available Options
• Conductive AFM with ORCA™   • Scanning Tunnelling Microscopy (STM)   • iDrive™ magnetic actuated drive for imaging of soft samples in fluid   • Band Excitation for measurement of materials properties

For information regarding fees, training and using the Cypher™ AFM/APM,
contact Dr. Reza Loloee or Dr. Pengpeng Zhang.

Cypher™ AFM/SPM Scheduling Instructions

View Cypher™ Schedule

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